Prof. RNDr. Vaclav Valvoda, CSc.

Head of the Department of Electronic Structures

Office

1008, Ground floor, Ke Karlovu 5

Tel.

(02) 2191 1387

Fax

(02) 2491 1061

E-mail

valvoda@karlov.mff.cuni.cz

Curriculum Vitae

Born 18.9.1937

Professional career

• 1961 graduated at Faculty of Mathematics and Physics, Charles University, Prague
• 1961 Assistant at Department of Solid State Physics, the Faculty of Mathematics and Physics
• 1968 Ph.D. (CSc.) at the Charles University, Prague
• 1985 Head of the X-ray group at Department of Semiconductor Physics
• 1990 habilitation - Ass. Professor (Doc.) at the Charles University
• 1990-1992 Vice-dean for research and development at the Faculty of Mathematics and Physics
• 1992 Professor (Prof.) at the Charles University
• 1995 Head of the Department of Semiconductor Physics (since 1999 the Department of Electronic
• 1991 Award of the Czechoslovak Academy of Sciences (studies of thin films by X-ray diffraction) 1992 Award of the Minister of Education (textbook "Elements of Structure Analysis")
• 1993-96 project The X-ray Diffraction Centre in Prague supported by the US-Czechoslovak Joint Fund for Research and Technology.

Membership in scientific societies

• 1985-90 scientific secretary of the Czechoslovak Crystallographic Association
• 1993-95 member of the National Committee of IUCr
• 1997 member of the International Centre for Diffraction Data (ICDD, Newtown Square, Penn. USA)
• 1998 member of the Committee of the International X-ray Analysis Society

Visits abroad

• 1969 Indian Institute of Science, Bangalore, India (6 month)
• 1979 Twente University, Enschede, The Netherlands (6 month)
• 1991 Max-Planck-Institut, Stuttgart (2 month)

Scientific output and conference organisation

• More than 200 papers in refereed journals,
• Author of one chapter in the International Tables for Crystallography, Vol.C,
• 26 invited talks at international conferences,
• Visiting professor in eleven European universities,
• chairman of the programme committee of two international conferences on Advanced Methods in X-ray and Neutron Structure Analysis of Materials,
• co-organiser of three Round Robin tests in 27 Czech and Slovak X-ray laboratories and of the Symposium on Protective Coatings and Thin Films in the E-MRS 1999 Spring Meeting in Strasbourg.

Selected publications

1. V. Valvoda, R. Kuzel Jr. and J. Musil: Structure of TiN Coatings Deposited at relatively High Rates and Low Temperatures by Magnetron Sputtering, Thin Solid Films, 156(1988)53.
2. V. Valvoda, R. Cerny, R. Kuzel Jr., J. Musil and V. Poulek: Dependence of Microstructure of TiN Coatings on their Thickness, Thin Solid Films, 158(1988)225.
3. V. Valvoda, R. Cerny, R. Kuzel Jr., L. Dobiásová, J. Musil, V. Poulek and J. Vyskocil: X-ray Analysis of Heat-Treated Titanium Nitride Films, Thin Solid Films, 170(1989)201.
4. V. Valvoda, R. Kuzel Jr., R. Cerny, D. Rafaja, J. Musil, S. Kadlec and A.J. Perry: Microstructure of TiN Thin Films Studied by Seemann-Bohlin X-ray Diffractometry, Thin Solid Films, 193-4 (1990)401.
5. V. Valvoda, A.J. Perry, L. Hultman, J. Musil and S. Kadlec: On Picostructural Models of Physically Vapor-Deposited Films of Titanium Nitride, Surface and Coatings Technology, 49(1991)181.
6. V. Valvoda: Glory and Misery of the Structure Analysis of Thin Polycrystalline Films ,Mater.Sci.Forum, 79-82(1991)503.
7. A.J. Perry, V. Valvoda and D. Rafaja: Residual Stress Measurement in TiN, ZrN and HfN Films Using the Seemann-Bohlin Method, Thin Solid Films, 214(1992)169.
8. R. Kuzel Jr., R. Cerny, V. Valvoda, M. Blomberg and M. Merisalo: Complex XRD Microstructural Studies of Hard Coatings Applied to PVD-deposited TiN Films, Thin Solid Films, 247(1994)64.
9. M. Chládek, C. Dorner, A. Buchal, V. Valvoda, H. Hoffmann: Quantitative in-situ x-ray diffraction analysis of magnetic multilayers during annealing , J.Appl.Phys., 80(3)(1996)1437-1445.
10. M. Chládek, V. Valvoda, C. Dorner, V. Holy, J. Grim: Quantitative study of interface roughness replication in multilayers using x-ray reflectivity and transmission electron microscopy, Appl.Phys.Lett., 69(9)(1996)1318-1320.
11. V. Valvoda, M. Chládek, R. Cerny: Joint texture refinement, J.Appl.Cryst., 29 (1996) 48-52.
12. M. Chládek, C. Dorner, M. Matner, H. Hoffmann, V. Valvoda: Structural and magnetic properties of Ni81Fe19/Ag multilayers with ultrathin Ni81Fe19 sublayres, J.Phys. C 9 (1997) 4557-4574.
13. M. Chládek, V. Valvoda, C. Dorner, W. Ernst: Quantitative comparison of structural parameters of magnetic multilayers obtained by diffraction methods and by direct imaging techniques - I, Interlayer structure, Journal of Magnetism and Magnetic Materials 172 (1997) 209-217.
14. V. Valvoda: Characterisation of TiN coatings by XRD, in: Y. Pauleau, P. Barna (eds.), Protective Coatings and Thin films, Kluwer Academic Press,, Dordrecht 1997, pp. 299-305. ISBN 0-7923-4380-8.